开尔文探针力显微镜

开尔文探针力显微镜(Kelvin probe force microscope, KPFM)是一种原子力显微镜,于1991年问世[1]。开尔文探针力显微镜利用微悬臂感受和放大悬臂上尖细探针与受测样品原子之间的作用力,从而达到检测的目的,具有原子级的分辨率。

In Kelvin probe force microscopy, a conducting cantilever is scanned over a surface at a constant height in order to map the work function of the surface.

参考

编辑
  1. ^ M. Nonnenmacher, M. P. O'Boyle, and H. K. Wickramasinghe. Kelvin probe force microscopy (PDF). Appl. Phys. Lett. 1991, 58 (25): 2921. Bibcode:1991ApPhL..58.2921N. doi:10.1063/1.105227. (原始内容 (free-download pdf)存档于2009-09-20). 

连结

编辑
  • Masaki Takihara. Kelvin probe force microscopy. Takahashi Lab., Institute of Industrial Science, University of Tokyo. 9 December 2008 [29 February 2012]. (原始内容存档于2012-10-29).  – Full description of the principles with good illustrations to aid comprehension